NDT Papers and Publications

Resolving capabilities of phased array sectorial scans (S-scans) on diffracted tip signals

This paper demonstrates the significant improvement available with phased array Sectorial (S-) scans for resolving crack tip signals using back-scattered diffraction on thinner plates. Initially, phased arrays and the factors affecting resolution are described, such as aperture and focusing. Another key feature is the use of piezo-composite array probes, which have shorter pulses. A third factor is S-scan imaging, which significantly improves crack tip signal identification. Some experiments show the resolving capabilities of phased arrays.

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Advanced Flaw Sizing Handbook By J. Mark Davis

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Other Books By J. Mark Davis

UT Math Formula Handbook
ET Math Formula Handbook
RT Math Formula Handbook

Advanced UT Flaw Sizing Handbook